Table 1 Sample descriptions available on the web. The descriptions contain the name, size or amount, analysis history, storage, condition availability of the Ryugu Sample AO, and scientific reference information related to the sample

Sample name

The sample name should be unique, as X0000. The first capital letter X represents the chamber name where the sample was recovered, followed by the four-digit sequential number 0000. When the sample X0000 is divided into sub-samples, a new sample name X0000-abc is given for each sub-sample. After the hyphenation, no format restriction is assigned

Tentative name

A temporal/unofficial name or nickname of the sample that requires no specific format. This is given for traceability of the sample handling record because some samples are handled with a temporal name before being given the official sample name

Chamber

The name of the sample chamber of the sample catcher (A, B, or C), where the sample was recovered

Sample form

The form of the sample, such as “individual particle,” “aggregate,” “gas,” and “previously allocated sample.” The previously allocated sample indicates that the sample has been analyzed after the initial description and the general term for “polished section,” “FIB section,” and so on

Condition

The current sample condition (pristine or not). The term “pristine” here implies that the sample has not been exposed to air nor experienced any destructive analysis but has only undergone the initial description measurements (e.g., optical microscope, MicrOmega and FT-IR)

Category

An identifier of the sample type (1: Ryugu material, 2: others such as potential contaminants)

Initial weight (mg)

The sample weight (mg) measured in the JAXA clean chamber for the first time

Weight (mg)

The sample weight (mg) is given here if it was remeasured after the initial measurement

Size: long length (mm)

The maximum Feret diameter, known as the maximum caliper length, of an individual particle (mm) measured by ImageJ (Schneider et al. 2012) on a microscope image captured in the clean chamber. This information is given only for individual particles, not for aggregates

Size: short length (mm)

The minimum Feret diameter, known as the minimum caliper length, of an individual particle (mm) measured by ImageJ (Schneider et al. 2012) on a microscope image captured in the clean chamber. This information is given only for individual particles, not for aggregates

Size: height (mm)

The height (mm) measured by focusing on the top and bottom of the particle using the optical microscope. This information is given only for individual particles, not for aggregates

Pressure (Pa)

The sample gas pressure inside the gas container. Available for gas samples, not for solid samples

Volume (mL)

The sample volume. Available for gas or liquid samples, not for solid samples

Status

The current sample status (on-loan, transfer, lost, or consumed). The term “consumed” means consumption of a sample by a destructive analysis

Measurement history

A brief description of analysis records

Distribution history

A brief description of distribution records

Container

The ID of the sample dish

Storage

The name of current sample storage

Quality

An identifier of the level and a brief description of the sample’s cleanliness. Class-1 or -2 indicates the cleanliness level. Three capital letters in a bracket after the class number describe the environmental conditions that the sample has been exposed to, with three ranks from A–C. For example, “Class-1 (AAA)” describes the best conditions

Class-1 or -2 indicates the cleanliness level

1: the sample has been handled with the standard process

2: the sample has been handled with a nonstandard process (e.g., the sample was accidentally touched with a Teflon material.)

Three capital letters indicate the environmental conditions with three ranks from A–C

The first letter explains the atmospheric condition

A: under vacuum or purified nitrogen condition

B: other gasses

C: atmospheric air on the earth

The second letter explains the contact materials of the sample

A: quarts glass, sapphire glass, stainless steel, and aluminum

B: Teflon

C: other materials (such as Viton)

The third letter explains the cleaning process of the contact materials of the sample

A: a combination process of ultrasonic, degreasing, alkali solvent, and ozone cleaning

B: a combination of ultrasonic cleaning and degreasing

C: other cleaning methods or no cleaning

Description

Brief description about the sample

Reference

Access to the published papers related to this sample

Data source

Access to directories of the DARTS file server for the entire processed analytical data of the sample

Family tree (Parent and child)

A description of the relationship among the sample, the sample source (mother sample), and the sub-sample. There are several parent samples when the sample is a mixture of several sample sources