Figure 7From: Subgrain boundary analyses in deformed orthopyroxene by TEM/STEM with EBSD-FIB sample preparation techniqueEDS analysis of the dislocation. (a) STEM-HAADF image of the dislocation, to show the area for the EDS analysis. (b) EDS line profile along X-Y, by averaging the data along the vertical direction in the rectangle in (a).Back to article page