Figure 4
From: ToF-SIMS analysis of carbonaceous particles in the sample catcher of the Hayabusa spacecraft
Images of secondary positive (+) and negative (−) ion distributions of RB-QD04-0037-01 by ToF-SIMS (after pre-sputtering). The brighter color corresponds to higher concentrations of secondary total ion and specific ion (m/z). Scale bars of ToF-SIMS analysis are 10 μm.