Figure 5
From: ToF-SIMS analysis of carbonaceous particles in the sample catcher of the Hayabusa spacecraft
Images of secondary ion distributions of RA-QD02-0180 by ToF-SIMS. Images of secondary positive (+) and negative (−) ion distributions of RA-QD02-0180 by ToF-SIMS with its backscattered electron image by SEM. The brighter color corresponds to higher concentrations of secondary total ion and specific ion (m/z). Scale bars of ToF-SIMS analysis are 10 μm.