Fig. 2From: Adhering grains and surface features on two Itokawa particlesScanning helium ion (a, c, e–g) and secondary electron (b, d, h) microscope images of different features identified on the surfaces of both Itokawa particles such as splash melts (a, b, f), abrasion features (c), and blistered and unblistered surfaces (d, e, g, h)Back to article page