Instrument | Measurement | |
---|---|---|
LEP-e | Low-energy particle experiments–electron analyzer | 19 eV–20 keV (electron) |
MEP-e | Medium-energy particle experiments–electron analyzer | 7–87 keV (electron) |
HEP | High-energy electron experiments | |
HEP-L HEP-H |
70 keV–1 MeV (electron) 0.7–2 MeV (electron) | |
XEP | Extremely high-energy electron experiment | 400 keV–20 MeV (electron) |
LEP-i | Low-energy particle experiments–ion mass analyzer | 10 eV/q–25 keV/q (ions) (mass discriminations) |
MEP-i | Medium-energy particle experiments–ion mass analyzer | 10–180 keV/q (ions) (mass discriminations) |
PWE | Plasma wave experiment | |
Electric field detector (EFD) | DC-512 Hz (electric field waveform and spectrum) | |
Onboard frequency analyzer (OFA) |
10 Hz–20 kHz (electric field spectrum) 1 Hz–20 kHz (magnetic field spectrum) | |
Waveform capture (WFC) |
10 Hz–20 kHz (electric field waveform) 1 Hz–20 kHz (magnetic field waveform) | |
High-frequency analyzer (HFA) |
10 kHz–10 MHz (electric field spectrum) 10 kHz–100 kHz (magnetic field spectrum) | |
MGF | Magnetic field experiment | DC–256 Hz (magnetic field waveform) |
S-WPIA | Software-type wave–particle interaction analyzer | Phase between waves and particles |