Fig. 2From: The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materialsPictures of a the Kochi grid, b a sample post of the Kochi grid, c the Kochi grid in a JEOL-type transmission electron microscopy (TEM) sample holder, and d the Kochi clamp with a commercial TEM gridBack to article page