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Earth, Planets and Space
Fig. 5 | Earth, Planets and Space

Fig. 5

From: The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materials

Fig. 5

A thin section of an Antarctic micrometeorite (AMM), a back-scattered electron image of the AMM, TT006b101, before focused-ion beam apparatus (FIB) processing, b the FIB-thin section attached to a post of the Kochi grid, c bright-field TEM image with a selected area electron diffraction pattern of Mg,Al-bearing magnetite as an inset, d NanoSIMS elemental ratio and O isotope maps

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