Fig. 3

a A TEM image of the boundary area between etch pits of grain B and a precipitation feature. Flake-like particles can be observed in this area. b–f EDS C, Si, Mg, Fe, and O elemental mappings of the area (a)
a A TEM image of the boundary area between etch pits of grain B and a precipitation feature. Flake-like particles can be observed in this area. b–f EDS C, Si, Mg, Fe, and O elemental mappings of the area (a)