Fig. 1From: Trace-element analysis of mineral grains in Ryugu rock fragment sections by synchrotron-based confocal X-ray fluorescenceXRF detection setup used at beamline P06 to analyse a Ryugu sections C0033-01 and C0033-04 fixed in epoxy disks and b the geological glass reference material ATHO-G. Confocal SDD detector on the left, 4-element SDD detector on the right. Both are positioned, respectively, under opposite angles of 47° and 72°. The incident SR beam is indicated with a red arrowBack to article page