Fig. 2
From: Weakening behavior of the shallow megasplay fault in the Nankai subduction zone
Shear device and experimental data example. A Schematic diagram of the shear device used in this study. The lower sample cell holder (in darker grey) moves to the left as shearing is induced in the sample. B Example data from one set of experiments at conducted at 14 MPa effective normal stress, gray background indicates data shown in the inset. C Friction data during a velocity step overlain by modeled an inverse model over 1 mm, net change in frictional strength is shown as Γ. D Friction data during a velocity step modeled over 5 mm, net change in frictional strength again shown as Γ. VS: velocity step