Figure 4

Images obtained from TEM/STEM-EDS (a, b). A dashed box in the secondary electron image (SEI) of RA-QD02-0120 shows the area of dark field (DF) image; and the EDS images show color elemental maps of Si, N, O, C, and Ca. More intense colors correspond to higher concentrations of these elements. Vertical artifacts in the SEI image are from FIB fabrication of the UTS.