Order | Method | Data | Sample damage |
---|---|---|---|
1 | FT-IR | Molecular structure | - |
2 | ToF-SIMS | Elemental mapping and analysis of molecular species | Smoothing of FT-IR spectra, moderate change of isotope ratio of NanoSIMS analysis (Ito et al. 2014) |
3 | NanoSIMS | Isotope ratio and mapping | Large disturbance of ToF-SIMS result by Cs + implantation (Naraoka et al. 2014) |
4 | Raman spectroscopy | Molecular structure | Thermal damage by laser (not evaluated in this paper) |
5 | XANES | Molecular structure | Sample destruction by FIB sectioning |
6 | TEM/STEM | Nanoscale texture and elemental mapping | Sample destruction by FIB sectioning, electron beam damage on molecular structure (Yabuta et al. 2014) |