Curves for calculated S-I reaction progress, release rate of SiO
, and sensitivity test results. (a) Calculated S-I reaction progress at plate interface along modeled thermal structures of Muroto transect with and without fluid flow (Spinelli and Wang 2008), indicating cumulative amounts of SiO2 loss during the reaction. (b) Release rate of SiO2 as a function of temperature. Results of sensitivity test for (c) plate convergence rate and (d) initial state of%S in S-I.