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Figure 2 | Earth, Planets and Space

Figure 2

From: Subgrain boundary analyses in deformed orthopyroxene by TEM/STEM with EBSD-FIB sample preparation technique

Figure 2

EBSD analysis and SEM image of a TEM specimen. (a) EBSD pattern from Opx surface and (b) corresponding drawing of Kikuchi pattern with the same crystal orientation. (c) Pole figures to show the crystal orientation of the Opx. The arrows in (a), (b), and (c) indicate the [010] (or the b-axis) direction. (d) SEM image of a TEM specimen prepared with the FIB micro-sampling system. Notice that the thin film was attached to the copper mesh obliquely considering the direction of the b-axis determined by EBSD, in order to make the incident beam parallel to the b-axis in TEM.

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