Figure 6From: Subgrain boundary analyses in deformed orthopyroxene by TEM/STEM with EBSD-FIB sample preparation techniqueFiltered Cs-corrected STEM-HAADF image of the dissociated (100) [001] dislocation, recorded along the b-axis. The dislocation cores are circled, and the unit cells of Opx (rectangles) and Cpx (parallelograms) are superimposed.Back to article page