TEM and EDS data of the multilayer rims on orthopyroxene. (a) BF image of the multilayer rim on the edge of the pyroxene grain. (b) HAADF image of the rim with outer and inner layers indicated by arrows. (c) Line profile acquired from the edge of the grain, through the multilayer rim to the interior. Red dashed lines indicate boundaries between layers on the grain exterior and the underlying grain interior. (d) HAADF image of the multilayer rim and location of the line profile. (e-g) EDS spectral images of the multilayer rim. (h) HRTEM image of the multilayer rim with yellow arrows indicating the zone of nanocrystallinity and blue arrows indicating amorphous region. The white dashed line indicates the edge of the grain, and the inset FFT shows discrete reflections measuring 0.223 nm, indicating nanocrystalline nature of the outermost layer.