Fig. 3From: The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materialsPictures of the Kochi subsample holder for the nanoscale secondary ion mass spectrometer (NanoSIMS): a a NanoSIMS subsample holder for the Kochi grid, b a NanoSIMS subsample holder for the Kochi clamp, and c a commercial NanoSIMS holder with a subsample holder for Kochi gridBack to article page