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Fig. 6 | Earth, Planets and Space

Fig. 6

From: The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materials

Fig. 6

Images of carbonaceous grains in the FIB section of Y-791198. a Scanning transmission X-ray microscopy (STXM) C K-edge spectral image, b NanoSIMS 12C image, c NanoSIMS 12C14N image, d high-angle annular dark field (HAADF) and carbon Kα X-ray images of the G1 and G3 carbonaceous grains in a by scanning transmission electron microscopy (STEM-EDS). e C K-edge spectra of G1 to G4

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