Fig. 1From: A low-energy particle experiment for both ion and electron measurements using a single microchannel plate-based detectorCross-sectional view of the ion optics and MCP-based detector in the LEP experiment. The solid arrow indicates the trajectory of incident particles at elevation \(\alpha\) move through the ESA and into the MCP-based detector at the bottom. The dashed arrow indicates the trajectories of secondary electrons emitted from the carbon foil. HVPS1 and 2 supply VSwp and \({V}_{{\text{Fix}}}\), and \({V}_{{\text{MCP}}}\), respectivelyBack to article page