Fig. 5From: Adhering grains and surface features on two Itokawa particlesScanning helium ion microscope secondary electron image of a splash melt (a) in which we made the focused ion beam section (FIB; a white line) shown on the right (b - dark-field scanning transmission electron microscopy image). The splash melt is found on top of a FeO-rich olivine grain (Fa25, Fa - fayalite). The surface of this splash melt is vesicular. The white dashed line outlines the splash meltBack to article page